High resolution XUV spectroscopy of x-ray laser plasmas

J. A. Koch, P. J. Batson, M. R. Carter, K. L. Chapman, L. B. Da Silva, B. J. MacGowan, D. L. Matthews, S. Mrowka, J. H. Scofield, G. Shimkaveg, J. H. Underwood, R. S. Walling

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

This paper discusses recent progress in LLNL's high resolution XUV spectroscopy efforts with x-ray laser plasmas. We describe the instrumentation used, and we present preliminary time-resolved data on the spectral profiles of several XUV (extreme ultraviolet) lines from Ne-like Se and Ne-like Y x-ray lasers which have been obtained with instrumental resolutions (λ/Δλ) of ∼10,000. The Se data indicates that the 206.4 Å J = 2-1 laser line narrows below the expected 400 eV Doppler width (35 mÅ) when amplified through ∼6 gain lengths, while the Y data shows no evidence of the J = 0-1 laser predicted to be nearly resonant with the J = 2-1 laser at 154.9 Å.

Original languageEnglish (US)
Pages (from-to)131-137
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1551
DOIs
StatePublished - Feb 5 1992
Externally publishedYes
EventUltrashort Wavelength Lasers 1991 - San Diego, United States
Duration: Jul 21 1991 → …

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Koch, J. A., Batson, P. J., Carter, M. R., Chapman, K. L., Da Silva, L. B., MacGowan, B. J., Matthews, D. L., Mrowka, S., Scofield, J. H., Shimkaveg, G., Underwood, J. H., & Walling, R. S. (1992). High resolution XUV spectroscopy of x-ray laser plasmas. Proceedings of SPIE - The International Society for Optical Engineering, 1551, 131-137. https://doi.org/10.1117/12.134815