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High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses
C. A. Mears, Simon E. Labov, L. H. Hiller, Matthias Frank, H. Netel, Fatma Azgui, A. T. Barfknecht
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations