High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

C. A. Mears, Simon E. Labov, L. H. Hiller, Matthias Frank, H. Netel, Fatma Azgui, A. T. Barfknecht

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Fingerprint Dive into the research topics of 'High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses'. Together they form a unique fingerprint.

Chemical Compounds

Physics & Astronomy

Engineering & Materials Science