High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

C. A. Mears; Simon E. Labov; L. H. Hiller; Matthias Frank; H. Netel; Fatma Azgui; A. T. Barfknecht

doi:10.1109/77.403240

High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

C. A. Mears, Simon E. Labov, L. H. Hiller, Matthias Frank, H. Netel, Fatma Azgui, A. T. Barfknecht

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.

Original language	English (US)
Pages (from-to)	3069-3072
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	5
Issue number	2
DOIs	https://doi.org/10.1109/77.403240
State	Published - Jan 1 1995
Externally published	Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Physics and Astronomy (miscellaneous)

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High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses. / Mears, C. A.; Labov, Simon E.; Hiller, L. H.; Frank, Matthias; Netel, H.; Azgui, Fatma; Barfknecht, A. T.

In: IEEE Transactions on Applied Superconductivity, Vol. 5, No. 2, 01.01.1995, p. 3069-3072.

Research output: Contribution to journal › Article › peer-review

@article{8fe427a5c4de4afc80e89d3663e791e1,

title = "High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses",

abstract = "Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.",

author = "Mears, {C. A.} and Labov, {Simon E.} and Hiller, {L. H.} and Matthias Frank and H. Netel and Fatma Azgui and Barfknecht, {A. T.}",

year = "1995",

month = jan,

day = "1",

doi = "10.1109/77.403240",

language = "English (US)",

volume = "5",

pages = "3069--3072",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

}

TY - JOUR

T1 - High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

AU - Mears, C. A.

AU - Labov, Simon E.

AU - Hiller, L. H.

AU - Frank, Matthias

AU - Netel, H.

AU - Azgui, Fatma

AU - Barfknecht, A. T.

PY - 1995/1/1

Y1 - 1995/1/1

N2 - Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.

AB - Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.

UR - http://www.scopus.com/inward/record.url?scp=0029324092&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029324092&partnerID=8YFLogxK

U2 - 10.1109/77.403240

DO - 10.1109/77.403240

M3 - Article

AN - SCOPUS:0029324092

VL - 5

SP - 3069

EP - 3072

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

SN - 1051-8223

IS - 2

ER -

High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

Abstract

ASJC Scopus subject areas

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