High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

C. A. Mears; Simon E. Labov; L. H. Hiller; Matthias Frank; H. Netel; Fatma Azgui; A. T. Barfknecht

doi:10.1109/77.403240

High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

C. A. Mears, Simon E. Labov, L. H. Hiller, Matthias Frank, H. Netel, Fatma Azgui, A. T. Barfknecht

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.

Original language	English (US)
Pages (from-to)	3069-3072
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	5
Issue number	2
DOIs	https://doi.org/10.1109/77.403240
State	Published - Jan 1 1995
Externally published	Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Physics and Astronomy (miscellaneous)

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10.1109/77.403240

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High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses. / Mears, C. A.; Labov, Simon E.; Hiller, L. H.; Frank, Matthias; Netel, H.; Azgui, Fatma; Barfknecht, A. T.

In: IEEE Transactions on Applied Superconductivity, Vol. 5, No. 2, 01.01.1995, p. 3069-3072.

Research output: Contribution to journal › Article › peer-review

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High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

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