High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses

C. A. Mears, Simon E. Labov, L. H. Hiller, Matthias Frank, H. Netel, Fatma Azgui, A. T. Barfknecht

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.

Original languageEnglish (US)
Pages (from-to)3069-3072
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume5
Issue number2
DOIs
StatePublished - Jan 1 1995
Externally publishedYes

Fingerprint

Niobium
X ray spectrometers
Tunnel junctions
Full width at half maximum
Aluminum
Ionization
Tunnels
trapping
spectrometers
Semiconductor materials
Detectors
aluminum
X rays
high resolution
x rays
tunnel junctions
niobium
tunnels
absorbers
traps

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)

Cite this

High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses. / Mears, C. A.; Labov, Simon E.; Hiller, L. H.; Frank, Matthias; Netel, H.; Azgui, Fatma; Barfknecht, A. T.

In: IEEE Transactions on Applied Superconductivity, Vol. 5, No. 2, 01.01.1995, p. 3069-3072.

Research output: Contribution to journalArticle

Mears, C. A. ; Labov, Simon E. ; Hiller, L. H. ; Frank, Matthias ; Netel, H. ; Azgui, Fatma ; Barfknecht, A. T. / High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses. In: IEEE Transactions on Applied Superconductivity. 1995 ; Vol. 5, No. 2. pp. 3069-3072.
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