Abstract
Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 3069-3072 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Volume | 5 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jan 1 1995 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)
Cite this
High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses. / Mears, C. A.; Labov, Simon E.; Hiller, L. H.; Frank, Matthias; Netel, H.; Azgui, Fatma; Barfknecht, A. T.
In: IEEE Transactions on Applied Superconductivity, Vol. 5, No. 2, 01.01.1995, p. 3069-3072.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - High-Resolution Superconducting X-Ray Spectrometers with Aluminum Trapping Layers of Different Thicknesses
AU - Mears, C. A.
AU - Labov, Simon E.
AU - Hiller, L. H.
AU - Frank, Matthias
AU - Netel, H.
AU - Azgui, Fatma
AU - Barfknecht, A. T.
PY - 1995/1/1
Y1 - 1995/1/1
N2 - Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.
AB - Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.
UR - http://www.scopus.com/inward/record.url?scp=0029324092&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0029324092&partnerID=8YFLogxK
U2 - 10.1109/77.403240
DO - 10.1109/77.403240
M3 - Article
AN - SCOPUS:0029324092
VL - 5
SP - 3069
EP - 3072
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
SN - 1051-8223
IS - 2
ER -