High-resolution large-area high-energy x-ray tomography

James E. Trebes, Kenneth W. Dolan, Waleed S. Haddad, Jerry J. Haskins, Richard A. Lerche, Clinton M. Logan, Dwight E. Perkins, Daniel J. Schneberk, Derrill Rikard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


An x-ray tomography system is being developed for high resolution inspection of large objects. The goal is to achieve 25 micron resolution over object sizes that are tens of centimeters in extent. Typical objects will be metal in composition and therefore high energy, few MeV x-rays will be required. A proof-of-principle system with a limited field of view has been developed. Preliminary results are presented.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Number of pages4
StatePublished - 1997
Externally publishedYes
EventDevelopments in X-Ray Tomography - San Diego, CA, United States
Duration: Jul 28 1997Jul 28 1997


OtherDevelopments in X-Ray Tomography
Country/TerritoryUnited States
CitySan Diego, CA


  • CCD imaging
  • Glass scintillator
  • X-ray tomography

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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