Growth model for pulsed-laser deposited perovskite oxide films

Xu Wang; Yi Yan Fei; Xiang Dong Zhu; Hui Bin Lu; Guo Zhen Yang

doi:10.1088/0256-307X/25/2/084

Growth model for pulsed-laser deposited perovskite oxide films

Xu Wang, Yi Yan Fei, Xiang Dong Zhu, Hui Bin Lu, Guo Zhen Yang

Physics, Applied Physics

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.

Original language	English (US)
Pages (from-to)	663-666
Number of pages	4
Journal	Chinese Physics Letters
Volume	25
Issue number	2
DOIs	https://doi.org/10.1088/0256-307X/25/2/084
State	Published - Feb 1 2008

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Physics and Astronomy(all)

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abstract = "We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.",

author = "Xu Wang and Fei, {Yi Yan} and Zhu, {Xiang Dong} and Lu, {Hui Bin} and Yang, {Guo Zhen}",

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T1 - Growth model for pulsed-laser deposited perovskite oxide films

AU - Wang, Xu

AU - Fei, Yi Yan

AU - Zhu, Xiang Dong

AU - Lu, Hui Bin

AU - Yang, Guo Zhen

PY - 2008/2/1

Y1 - 2008/2/1

N2 - We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.

AB - We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.

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EP - 666

JO - Chinese Physics Letters

JF - Chinese Physics Letters

SN - 0256-307X

IS - 2

ER -

Growth model for pulsed-laser deposited perovskite oxide films

Abstract

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