Abstract
We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 663-666 |
| Number of pages | 4 |
| Journal | Chinese Physics Letters |
| Volume | 25 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 1 2008 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Growth model for pulsed-laser deposited perovskite oxide films. / Wang, Xu; Fei, Yi Yan; Zhu, Xiang Dong; Lu, Hui Bin; Yang, Guo Zhen.
In: Chinese Physics Letters, Vol. 25, No. 2, 01.02.2008, p. 663-666.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Growth model for pulsed-laser deposited perovskite oxide films
AU - Wang, Xu
AU - Fei, Yi Yan
AU - Zhu, Xiang Dong
AU - Lu, Hui Bin
AU - Yang, Guo Zhen
PY - 2008/2/1
Y1 - 2008/2/1
N2 - We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.
AB - We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.
UR - http://www.scopus.com/inward/record.url?scp=42649106454&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=42649106454&partnerID=8YFLogxK
U2 - 10.1088/0256-307X/25/2/084
DO - 10.1088/0256-307X/25/2/084
M3 - Article
AN - SCOPUS:42649106454
VL - 25
SP - 663
EP - 666
JO - Chinese Physics Letters
JF - Chinese Physics Letters
SN - 0256-307X
IS - 2
ER -