Growth model for pulsed-laser deposited perovskite oxide films

Xu Wang, Yi Yan Fei, Xiang Dong Zhu, Hui Bin Lu, Guo Zhen Yang

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


We present a multi-level growth model that yields some of the key features of perovskite oxide film growth as observed in the reflection high energy electron diffraction (RHEED) and ellipsometry studies. The model describes the effect of deposition, temperature, intra-layer transport, interlayer transport and Ostwald ripening on the morphology of a growth surface in terms of the distribution of terraces and step edges during and after deposition. The numerical results of the model coincide well with the experimental observation.

Original languageEnglish (US)
Pages (from-to)663-666
Number of pages4
JournalChinese Physics Letters
Issue number2
StatePublished - Feb 1 2008

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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