Flat-field correction technique for digital detectors

Research output: Chapter in Book/Report/Conference proceedingConference contribution

101 Citations (Scopus)

Abstract

The effects of the stationary noise patterns and variable pixel responses that commonly occur with uniform exposure of digital detectors can be effectively reduced by simple "flat-field" image processing methods. These methods are based upon a linear system response and the acquisition of an image (or images) acquired at a high exposure to create an inverse matrix of values that when applied to an uncorrected image, remove the effects of the stationary noise components. System performance is optimized when the correction image is totally free of statistical variations. However, the stationary noise patterns will not be effectively removed for flat-field images that are acquired at a relatively low exposure or for systems with non-linear response to incident exposure variations. A reduction in image quality occurs with the incomplete removal of the stationary noise patterns, resulting in a loss of detective quantum efficiency of the system. A more flexible approach to the global flat-field correction methodology is investigated using a pixel by pixel least squares fit to "synthesize" a variable flat-field image based upon the pixel value (incident exposure) of the image to be corrected. All of the information is stored in two "equivalent images" containing the slope and intercept parameters. The methodology provides an improvement in the detective quantum efficiency (DQE) due to the greater immunity of the stationary noise variation encoded in the slope/intercept parameters calculated on a pixel by pixel basis over a range of incident exposures. When the raw image contains a wide range of incident exposures (e.g., transmission through an object) the variable exposure flat-field correction methodology proposed here provides an improved match to the fixed-point noise superimposed in the uncorrected image, particularly for the higher spatial frequencies in the image as demonstrated by DQE(f) measurements. Successful application to clinical digital mammography biopsy images has been demonstrated, and benefit to other digital detectors appears likely.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.T. Dobbins III, J.M. Boone
Pages348-354
Number of pages7
Volume3336
DOIs
StatePublished - 1998
EventMedical Imaging 1998: Physics of Medical Imaging - San Diego, CA, United States
Duration: Feb 22 1998Feb 24 1998

Other

OtherMedical Imaging 1998: Physics of Medical Imaging
CountryUnited States
CitySan Diego, CA
Period2/22/982/24/98

Fingerprint

Pixels
Detectors
detectors
Quantum efficiency
pixels
Mammography
quantum efficiency
Biopsy
methodology
Image quality
Linear systems
Image processing
slopes
immunity
linear systems
image processing
acquisition
matrices

Keywords

  • Detective quantum efficiency
  • Digital detectors
  • Digital mammography biopsy system
  • Flat field correction
  • Image optimization
  • Image quality
  • Noise power spectrum

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Seibert, J. A., Boone, J. M., & Lindfors, K. K. (1998). Flat-field correction technique for digital detectors. In J. T. Dobbins III, & J. M. Boone (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3336, pp. 348-354) https://doi.org/10.1117/12.317034

Flat-field correction technique for digital detectors. / Seibert, J Anthony; Boone, John M; Lindfors, Karen K.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / J.T. Dobbins III; J.M. Boone. Vol. 3336 1998. p. 348-354.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Seibert, JA, Boone, JM & Lindfors, KK 1998, Flat-field correction technique for digital detectors. in JT Dobbins III & JM Boone (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3336, pp. 348-354, Medical Imaging 1998: Physics of Medical Imaging, San Diego, CA, United States, 2/22/98. https://doi.org/10.1117/12.317034
Seibert JA, Boone JM, Lindfors KK. Flat-field correction technique for digital detectors. In Dobbins III JT, Boone JM, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3336. 1998. p. 348-354 https://doi.org/10.1117/12.317034
Seibert, J Anthony ; Boone, John M ; Lindfors, Karen K. / Flat-field correction technique for digital detectors. Proceedings of SPIE - The International Society for Optical Engineering. editor / J.T. Dobbins III ; J.M. Boone. Vol. 3336 1998. pp. 348-354
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