Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation

Joshua D. Moss, Adam Oesterle, Michael Raiman, Erin E. Flatley, Andrew D. Beaser, Valluvan Jeevanandam, Liviu Klein, Takeyoshi Ota, Georg Wieselthaler, Nir Uriel, Roderick Tung

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