Evolution of bulk damage initiation in DKDP crystals

C. W. Carr, T. H. McMillian, M. C. Staggs, H. B. Radousky, S. G. Demos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

We investigate the evolution of laser-induced damage initiated in the bulk of DKDP crystals using in-situ microscopy. Experimental results indicate that at peek fluences greater than 10 J/cm 2, damage sites are formed with increasing number as a function of the laser fluence. Following plasma formation, cracks are observed which grow in size for tens of seconds after the termination of the laser pulse. Subsequent irradiation leads to modest increase in size only during the initial 2-5 pulses. Experimental results suggest that there is also relaxation of the stresses adjacent to a damage site for several hours after initial damage.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsA. Giesen, H. Weber
Pages429-433
Number of pages5
Volume4932
DOIs
StatePublished - 2003
Externally publishedYes
EventProceedings Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization - Boulder, CO, United States
Duration: Sep 16 2002Sep 18 2002

Other

OtherProceedings Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
CountryUnited States
CityBoulder, CO
Period9/16/029/18/02

Keywords

  • Bulk damage growth
  • DKDP
  • Laser damage

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Evolution of bulk damage initiation in DKDP crystals'. Together they form a unique fingerprint.

  • Cite this

    Carr, C. W., McMillian, T. H., Staggs, M. C., Radousky, H. B., & Demos, S. G. (2003). Evolution of bulk damage initiation in DKDP crystals. In A. Giesen, & H. Weber (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4932, pp. 429-433) https://doi.org/10.1117/12.472409