Effects of line focus width narrowing on amplification in Ne-like Se X-Ray Laser experiments

S. Jacquemot, J. Bruneau, L. B. Da Silva, A. Decoster, D. Desenne, J. P. Le Breton, M. Louls-Jacquet, B. J. MacGowan, D. L. Matthews

Research output: Contribution to journalConference article

4 Scopus citations

Abstract

Ne-like Se X-Ray Laser (XRL) experiments have been performed to examine the effects of line focus width narrowing onamplification in a collisional excitation scheme. Variation from 40 jm up to 180 zm has been investigated. Significant changesin temperature and ionization balance have been observed and explained from theoretical consideraüons.

Original languageEnglish (US)
Pages (from-to)180-189
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2012
DOIs
StatePublished - Feb 1 1994
Externally publishedYes
EventUltrashort Wavelength Lasers II 1993 - San Diego, United States
Duration: Jul 11 1993Jul 16 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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    Jacquemot, S., Bruneau, J., Da Silva, L. B., Decoster, A., Desenne, D., Le Breton, J. P., Louls-Jacquet, M., MacGowan, B. J., & Matthews, D. L. (1994). Effects of line focus width narrowing on amplification in Ne-like Se X-Ray Laser experiments. Proceedings of SPIE - The International Society for Optical Engineering, 2012, 180-189. https://doi.org/10.1117/12.167384