Effective-substrate theory for optical reflection from a layered substrate

J. P. Landry, X. Wang, Y. Y. Fei, X. D. Zhu

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective "semi-infinite medium" characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.

Original languageEnglish (US)
Pages (from-to)2021-2028
Number of pages8
JournalJournal of the Optical Society of America B: Optical Physics
Volume25
Issue number12
DOIs
StatePublished - Dec 1 2008

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optical reflection
ellipsometry
permittivity
thin films

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Statistical and Nonlinear Physics

Cite this

Effective-substrate theory for optical reflection from a layered substrate. / Landry, J. P.; Wang, X.; Fei, Y. Y.; Zhu, X. D.

In: Journal of the Optical Society of America B: Optical Physics, Vol. 25, No. 12, 01.12.2008, p. 2021-2028.

Research output: Contribution to journalArticle

Landry, J. P. ; Wang, X. ; Fei, Y. Y. ; Zhu, X. D. / Effective-substrate theory for optical reflection from a layered substrate. In: Journal of the Optical Society of America B: Optical Physics. 2008 ; Vol. 25, No. 12. pp. 2021-2028.
@article{455856728ef14ade8ca943f7411a386e,
title = "Effective-substrate theory for optical reflection from a layered substrate",
abstract = "We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective {"}semi-infinite medium{"} characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.",
author = "Landry, {J. P.} and X. Wang and Fei, {Y. Y.} and Zhu, {X. D.}",
year = "2008",
month = "12",
day = "1",
doi = "10.1364/JOSAB.25.002021",
language = "English (US)",
volume = "25",
pages = "2021--2028",
journal = "Journal of the Optical Society of America B: Optical Physics",
issn = "0740-3224",
publisher = "The Optical Society",
number = "12",

}

TY - JOUR

T1 - Effective-substrate theory for optical reflection from a layered substrate

AU - Landry, J. P.

AU - Wang, X.

AU - Fei, Y. Y.

AU - Zhu, X. D.

PY - 2008/12/1

Y1 - 2008/12/1

N2 - We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective "semi-infinite medium" characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.

AB - We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective "semi-infinite medium" characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.

UR - http://www.scopus.com/inward/record.url?scp=59949085964&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=59949085964&partnerID=8YFLogxK

U2 - 10.1364/JOSAB.25.002021

DO - 10.1364/JOSAB.25.002021

M3 - Article

AN - SCOPUS:59949085964

VL - 25

SP - 2021

EP - 2028

JO - Journal of the Optical Society of America B: Optical Physics

JF - Journal of the Optical Society of America B: Optical Physics

SN - 0740-3224

IS - 12

ER -