Abstract
We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective "semi-infinite medium" characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2021-2028 |
| Number of pages | 8 |
| Journal | Journal of the Optical Society of America B: Optical Physics |
| Volume | 25 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 1 2008 |
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ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Statistical and Nonlinear Physics
Cite this
Effective-substrate theory for optical reflection from a layered substrate. / Landry, J. P.; Wang, X.; Fei, Y. Y.; Zhu, X. D.
In: Journal of the Optical Society of America B: Optical Physics, Vol. 25, No. 12, 01.12.2008, p. 2021-2028.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Effective-substrate theory for optical reflection from a layered substrate
AU - Landry, J. P.
AU - Wang, X.
AU - Fei, Y. Y.
AU - Zhu, X. D.
PY - 2008/12/1
Y1 - 2008/12/1
N2 - We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective "semi-infinite medium" characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.
AB - We show that reflection of a monochromatic light from a semi-infinite medium covered with a stack of layered media is equivalent to that from an effective "semi-infinite medium" characterized by two distinct optical dielectric constants for the s-and p-polarized components, respectively. Such an effective-substrate approach simplifies the analysis of ellipsometry measurements of a wide range of surface-bound processes including thin-film growth and surface-bound reactions.
UR - http://www.scopus.com/inward/record.url?scp=59949085964&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=59949085964&partnerID=8YFLogxK
U2 - 10.1364/JOSAB.25.002021
DO - 10.1364/JOSAB.25.002021
M3 - Article
AN - SCOPUS:59949085964
VL - 25
SP - 2021
EP - 2028
JO - Journal of the Optical Society of America B: Optical Physics
JF - Journal of the Optical Society of America B: Optical Physics
SN - 0740-3224
IS - 12
ER -