Abstract
The effect of dissolution kinetics on feature size in dip-pen nanolithography was studied. The results indicated that the transition between the two distinct deposition regimes occurred at a dwell time independent of humidity. The results were described by a model which suggested that at short dwell times, the most important parameter controlling the feature size is the activation energy for thiol detachment. The model predicted dependencies of feature size on dwell time and tip speed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2555051-2555054 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 88 |
| Issue number | 25 I |
| State | Published - Jun 24 2002 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Effect of dissolution kinetics on feature size in dip-pen nanolithography. / Weeks, B. L.; Noy, Aleksandr; Miller, A. E.; De Yoreo, J. J.
In: Physical Review Letters, Vol. 88, No. 25 I, 24.06.2002, p. 2555051-2555054.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Effect of dissolution kinetics on feature size in dip-pen nanolithography
AU - Weeks, B. L.
AU - Noy, Aleksandr
AU - Miller, A. E.
AU - De Yoreo, J. J.
PY - 2002/6/24
Y1 - 2002/6/24
N2 - The effect of dissolution kinetics on feature size in dip-pen nanolithography was studied. The results indicated that the transition between the two distinct deposition regimes occurred at a dwell time independent of humidity. The results were described by a model which suggested that at short dwell times, the most important parameter controlling the feature size is the activation energy for thiol detachment. The model predicted dependencies of feature size on dwell time and tip speed.
AB - The effect of dissolution kinetics on feature size in dip-pen nanolithography was studied. The results indicated that the transition between the two distinct deposition regimes occurred at a dwell time independent of humidity. The results were described by a model which suggested that at short dwell times, the most important parameter controlling the feature size is the activation energy for thiol detachment. The model predicted dependencies of feature size on dwell time and tip speed.
UR - http://www.scopus.com/inward/record.url?scp=1242275848&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=1242275848&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:1242275848
VL - 88
SP - 2555051
EP - 2555054
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 25 I
ER -