Dry Transfer of van der Waals Crystals to Noble Metal Surfaces to Enable Characterization of Buried Interfaces

Andrey Krayev, Connor S. Bailey, Kiyoung Jo, Shuo Wang, Akshay Singh, Thomas Darlington, Gang Yu Liu, Silvija Gradecak, P. James Schuck, Eric Pop, Deep Jariwala

Research output: Contribution to journalArticle

Abstract

Two-dimensional (2D) transition-metal dichalcogenides (TMDCs) have been explored for many optoelectronic applications. Most of these applications require them to be on insulating substrates. However, for many fundamental property characterizations, such as mapping surface potential or conductance, insulating substrates are nonideal as they lead to charging and doping effects or impose the inhomogeneity of their charge environment on the atomically thin 2D layers. Here, we report a simple method of residue-free dry transfer of 2D TMDC crystal layers. This method is enabled via noble-metal (gold, silver) thin films and allows comprehensive nanoscale characterization of transferred TMDC crystals with multiple scanning probe microscopy techniques. In particular, intimate contact with underlying metal allows efficient tip-enhanced Raman scattering characterization, providing high spatial resolution (<20 nm) for Raman spectroscopy. Further, scanning Kelvin probe force microscopy allows high-resolution mapping of surface potential on transferred crystals, revealing their spatially varying structural and electronic properties. The layer-dependent contact potential difference is clearly observed and explained by charge transfer from contacts with Au and Ag. The demonstrated sample preparation technique can be generalized to probe many different 2D material surfaces and has broad implications in understanding of the metal contacts and buried interfaces in 2D material-based devices.

Original languageEnglish (US)
Pages (from-to)38218-38225
Number of pages8
JournalACS Applied Materials and Interfaces
Volume11
Issue number41
DOIs
StatePublished - Oct 16 2019

Fingerprint

Precious metals
Transition metals
Surface potential
Crystals
Metals
Scanning probe microscopy
Substrates
Silver
Gold
Electronic properties
Optoelectronic devices
Raman spectroscopy
Charge transfer
Raman scattering
Structural properties
Microscopic examination
Doping (additives)
Scanning
Thin films

Keywords

  • buried interfaces
  • near field
  • Raman spectroscopy
  • TERS
  • transition-metal dichalcogenides
  • van der Waals materials

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Dry Transfer of van der Waals Crystals to Noble Metal Surfaces to Enable Characterization of Buried Interfaces. / Krayev, Andrey; Bailey, Connor S.; Jo, Kiyoung; Wang, Shuo; Singh, Akshay; Darlington, Thomas; Liu, Gang Yu; Gradecak, Silvija; Schuck, P. James; Pop, Eric; Jariwala, Deep.

In: ACS Applied Materials and Interfaces, Vol. 11, No. 41, 16.10.2019, p. 38218-38225.

Research output: Contribution to journalArticle

Krayev, A, Bailey, CS, Jo, K, Wang, S, Singh, A, Darlington, T, Liu, GY, Gradecak, S, Schuck, PJ, Pop, E & Jariwala, D 2019, 'Dry Transfer of van der Waals Crystals to Noble Metal Surfaces to Enable Characterization of Buried Interfaces', ACS Applied Materials and Interfaces, vol. 11, no. 41, pp. 38218-38225. https://doi.org/10.1021/acsami.9b09798
Krayev, Andrey ; Bailey, Connor S. ; Jo, Kiyoung ; Wang, Shuo ; Singh, Akshay ; Darlington, Thomas ; Liu, Gang Yu ; Gradecak, Silvija ; Schuck, P. James ; Pop, Eric ; Jariwala, Deep. / Dry Transfer of van der Waals Crystals to Noble Metal Surfaces to Enable Characterization of Buried Interfaces. In: ACS Applied Materials and Interfaces. 2019 ; Vol. 11, No. 41. pp. 38218-38225.
@article{6974183c64404223a2c5796aad16c98b,
title = "Dry Transfer of van der Waals Crystals to Noble Metal Surfaces to Enable Characterization of Buried Interfaces",
abstract = "Two-dimensional (2D) transition-metal dichalcogenides (TMDCs) have been explored for many optoelectronic applications. Most of these applications require them to be on insulating substrates. However, for many fundamental property characterizations, such as mapping surface potential or conductance, insulating substrates are nonideal as they lead to charging and doping effects or impose the inhomogeneity of their charge environment on the atomically thin 2D layers. Here, we report a simple method of residue-free dry transfer of 2D TMDC crystal layers. This method is enabled via noble-metal (gold, silver) thin films and allows comprehensive nanoscale characterization of transferred TMDC crystals with multiple scanning probe microscopy techniques. In particular, intimate contact with underlying metal allows efficient tip-enhanced Raman scattering characterization, providing high spatial resolution (<20 nm) for Raman spectroscopy. Further, scanning Kelvin probe force microscopy allows high-resolution mapping of surface potential on transferred crystals, revealing their spatially varying structural and electronic properties. The layer-dependent contact potential difference is clearly observed and explained by charge transfer from contacts with Au and Ag. The demonstrated sample preparation technique can be generalized to probe many different 2D material surfaces and has broad implications in understanding of the metal contacts and buried interfaces in 2D material-based devices.",
keywords = "buried interfaces, near field, Raman spectroscopy, TERS, transition-metal dichalcogenides, van der Waals materials",
author = "Andrey Krayev and Bailey, {Connor S.} and Kiyoung Jo and Shuo Wang and Akshay Singh and Thomas Darlington and Liu, {Gang Yu} and Silvija Gradecak and Schuck, {P. James} and Eric Pop and Deep Jariwala",
year = "2019",
month = "10",
day = "16",
doi = "10.1021/acsami.9b09798",
language = "English (US)",
volume = "11",
pages = "38218--38225",
journal = "ACS applied materials & interfaces",
issn = "1944-8244",
publisher = "American Chemical Society",
number = "41",

}

TY - JOUR

T1 - Dry Transfer of van der Waals Crystals to Noble Metal Surfaces to Enable Characterization of Buried Interfaces

AU - Krayev, Andrey

AU - Bailey, Connor S.

AU - Jo, Kiyoung

AU - Wang, Shuo

AU - Singh, Akshay

AU - Darlington, Thomas

AU - Liu, Gang Yu

AU - Gradecak, Silvija

AU - Schuck, P. James

AU - Pop, Eric

AU - Jariwala, Deep

PY - 2019/10/16

Y1 - 2019/10/16

N2 - Two-dimensional (2D) transition-metal dichalcogenides (TMDCs) have been explored for many optoelectronic applications. Most of these applications require them to be on insulating substrates. However, for many fundamental property characterizations, such as mapping surface potential or conductance, insulating substrates are nonideal as they lead to charging and doping effects or impose the inhomogeneity of their charge environment on the atomically thin 2D layers. Here, we report a simple method of residue-free dry transfer of 2D TMDC crystal layers. This method is enabled via noble-metal (gold, silver) thin films and allows comprehensive nanoscale characterization of transferred TMDC crystals with multiple scanning probe microscopy techniques. In particular, intimate contact with underlying metal allows efficient tip-enhanced Raman scattering characterization, providing high spatial resolution (<20 nm) for Raman spectroscopy. Further, scanning Kelvin probe force microscopy allows high-resolution mapping of surface potential on transferred crystals, revealing their spatially varying structural and electronic properties. The layer-dependent contact potential difference is clearly observed and explained by charge transfer from contacts with Au and Ag. The demonstrated sample preparation technique can be generalized to probe many different 2D material surfaces and has broad implications in understanding of the metal contacts and buried interfaces in 2D material-based devices.

AB - Two-dimensional (2D) transition-metal dichalcogenides (TMDCs) have been explored for many optoelectronic applications. Most of these applications require them to be on insulating substrates. However, for many fundamental property characterizations, such as mapping surface potential or conductance, insulating substrates are nonideal as they lead to charging and doping effects or impose the inhomogeneity of their charge environment on the atomically thin 2D layers. Here, we report a simple method of residue-free dry transfer of 2D TMDC crystal layers. This method is enabled via noble-metal (gold, silver) thin films and allows comprehensive nanoscale characterization of transferred TMDC crystals with multiple scanning probe microscopy techniques. In particular, intimate contact with underlying metal allows efficient tip-enhanced Raman scattering characterization, providing high spatial resolution (<20 nm) for Raman spectroscopy. Further, scanning Kelvin probe force microscopy allows high-resolution mapping of surface potential on transferred crystals, revealing their spatially varying structural and electronic properties. The layer-dependent contact potential difference is clearly observed and explained by charge transfer from contacts with Au and Ag. The demonstrated sample preparation technique can be generalized to probe many different 2D material surfaces and has broad implications in understanding of the metal contacts and buried interfaces in 2D material-based devices.

KW - buried interfaces

KW - near field

KW - Raman spectroscopy

KW - TERS

KW - transition-metal dichalcogenides

KW - van der Waals materials

UR - http://www.scopus.com/inward/record.url?scp=85073027578&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85073027578&partnerID=8YFLogxK

U2 - 10.1021/acsami.9b09798

DO - 10.1021/acsami.9b09798

M3 - Article

C2 - 31512847

AN - SCOPUS:85073027578

VL - 11

SP - 38218

EP - 38225

JO - ACS applied materials & interfaces

JF - ACS applied materials & interfaces

SN - 1944-8244

IS - 41

ER -