Diagnostics of x-ray laser plasmas

H. A. Baldis, B. La Fontaine, J. Dunn, G. D. Enright, D. M. Villeneuve, M. D. Rosen, D. L. Matthews

Research output: Contribution to journalConference article

Abstract

Thomson scattering, x-ray diagnostics and optical interferometry are employed to characterize both collisionally excited and recombination x-ray laser plasmas. Spatially and timeresolved Thomson scattering spectra from carbon plasmas provide the electron and ion temperatures, which are compared with hydrodynamic computer modelling. The electron density is inferred from the recorded interferograms. Time-integrated X-ray spectra in the keV range are used to characterize very precisely the optimum irradiance conditions for lasing in Ne-like germanium plasmas. Also, electron temperatures obtained with the 5C/4C line ratio, assuming a PLTE model, are compared to Thomson scattering results.

Original languageEnglish (US)
Pages (from-to)114-120
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1551
DOIs
StatePublished - Feb 5 1992
EventUltrashort Wavelength Lasers 1991 - San Diego, United States
Duration: Jul 21 1991 → …

Fingerprint

Laser Plasma
X-ray Laser
x ray lasers
Thomson scattering
laser plasmas
Diagnostics
Scattering
Electron
Plasmas
X rays
Lasers
interferometry
Plasma
electron energy
Optical Interferometry
Germanium
Interferogram
Computer Modeling
Electron temperature
Irradiance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Baldis, H. A., La Fontaine, B., Dunn, J., Enright, G. D., Villeneuve, D. M., Rosen, M. D., & Matthews, D. L. (1992). Diagnostics of x-ray laser plasmas. Proceedings of SPIE - The International Society for Optical Engineering, 1551, 114-120. https://doi.org/10.1117/12.134813

Diagnostics of x-ray laser plasmas. / Baldis, H. A.; La Fontaine, B.; Dunn, J.; Enright, G. D.; Villeneuve, D. M.; Rosen, M. D.; Matthews, D. L.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1551, 05.02.1992, p. 114-120.

Research output: Contribution to journalConference article

Baldis, HA, La Fontaine, B, Dunn, J, Enright, GD, Villeneuve, DM, Rosen, MD & Matthews, DL 1992, 'Diagnostics of x-ray laser plasmas', Proceedings of SPIE - The International Society for Optical Engineering, vol. 1551, pp. 114-120. https://doi.org/10.1117/12.134813
Baldis HA, La Fontaine B, Dunn J, Enright GD, Villeneuve DM, Rosen MD et al. Diagnostics of x-ray laser plasmas. Proceedings of SPIE - The International Society for Optical Engineering. 1992 Feb 5;1551:114-120. https://doi.org/10.1117/12.134813
Baldis, H. A. ; La Fontaine, B. ; Dunn, J. ; Enright, G. D. ; Villeneuve, D. M. ; Rosen, M. D. ; Matthews, D. L. / Diagnostics of x-ray laser plasmas. In: Proceedings of SPIE - The International Society for Optical Engineering. 1992 ; Vol. 1551. pp. 114-120.
@article{a3bb5227fb85488ca7d629b0f332630f,
title = "Diagnostics of x-ray laser plasmas",
abstract = "Thomson scattering, x-ray diagnostics and optical interferometry are employed to characterize both collisionally excited and recombination x-ray laser plasmas. Spatially and timeresolved Thomson scattering spectra from carbon plasmas provide the electron and ion temperatures, which are compared with hydrodynamic computer modelling. The electron density is inferred from the recorded interferograms. Time-integrated X-ray spectra in the keV range are used to characterize very precisely the optimum irradiance conditions for lasing in Ne-like germanium plasmas. Also, electron temperatures obtained with the 5C/4C line ratio, assuming a PLTE model, are compared to Thomson scattering results.",
author = "Baldis, {H. A.} and {La Fontaine}, B. and J. Dunn and Enright, {G. D.} and Villeneuve, {D. M.} and Rosen, {M. D.} and Matthews, {D. L.}",
year = "1992",
month = "2",
day = "5",
doi = "10.1117/12.134813",
language = "English (US)",
volume = "1551",
pages = "114--120",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

TY - JOUR

T1 - Diagnostics of x-ray laser plasmas

AU - Baldis, H. A.

AU - La Fontaine, B.

AU - Dunn, J.

AU - Enright, G. D.

AU - Villeneuve, D. M.

AU - Rosen, M. D.

AU - Matthews, D. L.

PY - 1992/2/5

Y1 - 1992/2/5

N2 - Thomson scattering, x-ray diagnostics and optical interferometry are employed to characterize both collisionally excited and recombination x-ray laser plasmas. Spatially and timeresolved Thomson scattering spectra from carbon plasmas provide the electron and ion temperatures, which are compared with hydrodynamic computer modelling. The electron density is inferred from the recorded interferograms. Time-integrated X-ray spectra in the keV range are used to characterize very precisely the optimum irradiance conditions for lasing in Ne-like germanium plasmas. Also, electron temperatures obtained with the 5C/4C line ratio, assuming a PLTE model, are compared to Thomson scattering results.

AB - Thomson scattering, x-ray diagnostics and optical interferometry are employed to characterize both collisionally excited and recombination x-ray laser plasmas. Spatially and timeresolved Thomson scattering spectra from carbon plasmas provide the electron and ion temperatures, which are compared with hydrodynamic computer modelling. The electron density is inferred from the recorded interferograms. Time-integrated X-ray spectra in the keV range are used to characterize very precisely the optimum irradiance conditions for lasing in Ne-like germanium plasmas. Also, electron temperatures obtained with the 5C/4C line ratio, assuming a PLTE model, are compared to Thomson scattering results.

UR - http://www.scopus.com/inward/record.url?scp=85075640481&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85075640481&partnerID=8YFLogxK

U2 - 10.1117/12.134813

DO - 10.1117/12.134813

M3 - Conference article

AN - SCOPUS:85075640481

VL - 1551

SP - 114

EP - 120

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -