Development of XUV interferometry (155 A) using a soft x-ray laser

Luiz B. Da Silva, Troy W. Barbee, Robert C. Cauble, Peter Celliers, Dino R. Ciarlo, Stephen B. Libby, Richard A. London, Dennis L Matthews, Stanley J. Mrowka, Juan C. Moreno, James E. Trebes, Alan S. Wan, Franz A. Weber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Over the past several years we have developed a variety of techniques for probing plasmas with x-ray lasers. These have included direct high resolution plasma imaging to quantify laser produced plasma uniformities and moire deflectometry to measure electron density profiles in one-dimension. Although these techniques have been valuable a need existed for direct two dimensional measurements of electron densities in large high density plasmas. For this reason we have worked on developing an xuv interferometer compatible with the harsh environment of laser produced plasmas. This paper describes our design and presents some results showing excellent fringe visibility using the neon-like yttrium x-ray laser operating at 155 angstrom. The coherence properties of this x-ray laser source were measured using interferometry and are also discussed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages288-296
Number of pages9
Volume2520
StatePublished - 1995
Externally publishedYes
EventSoft X-Ray Lasers and Applications - San Diego, CA, USA
Duration: Jul 10 1995Jul 11 1995

Other

OtherSoft X-Ray Lasers and Applications
CitySan Diego, CA, USA
Period7/10/957/11/95

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Da Silva, L. B., Barbee, T. W., Cauble, R. C., Celliers, P., Ciarlo, D. R., Libby, S. B., London, R. A., Matthews, D. L., Mrowka, S. J., Moreno, J. C., Trebes, J. E., Wan, A. S., & Weber, F. A. (1995). Development of XUV interferometry (155 A) using a soft x-ray laser. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2520, pp. 288-296)