Determination of the relative visibility thresholds for basis functions of the Frazier-Jawerth transform

John B. Zimmerman, Rosalie J Hagge, Karin M. Hartzell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The current work undertakes the measurement of the thresholds for the visual detedction of the Frazier-Jawerth Transform (FJT) basis functions. These results will be used in the development of a psychovisually-based quantizer. The thresholds were determined by the use of psychovisual observer excperiments. It is shown that the detectability of the basis functions is in accord with current knowledge of the spatial frequency sensitivity of the human visual system. Corrected values, however, imply that the FJT quantizer may not match the properties of ordinary images as well as the psychovisual quyantizers used for such menthods as the discrete cosine transform.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsYongmin Kim
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages277-292
Number of pages16
Volume1232
ISBN (Print)0819402761
StatePublished - 1990
Externally publishedYes
EventMedical Imaging IV: Image Capture and Display - Newport Beach, CA, USA
Duration: Feb 4 1990Feb 5 1990

Other

OtherMedical Imaging IV: Image Capture and Display
CityNewport Beach, CA, USA
Period2/4/902/5/90

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Determination of the relative visibility thresholds for basis functions of the Frazier-Jawerth transform'. Together they form a unique fingerprint.

  • Cite this

    Zimmerman, J. B., Hagge, R. J., & Hartzell, K. M. (1990). Determination of the relative visibility thresholds for basis functions of the Frazier-Jawerth transform. In Y. Kim (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1232, pp. 277-292). Publ by Int Soc for Optical Engineering.