Defects in microcontact-printed and solution-grown self-assembled monolayers

A. S. Eberhardt, R. M. Nyquist, A. N. Parikh, T. Zawodzinski, B. I. Swanson

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

The structure of microcontact-printed self-assembled monolayers is significant for a number of technological applications as well as for a fundamental understanding of the self-assembly process. The structural differences between printed and solution-deposited monolayers of alkanethiol on Au(111) have been examined utilizing grazing incidence X-ray diffraction and atomic force microscopy. Although the local structures are found to be similar, the domain structure and therefore macroscopic packing of the molecules are found to vary. Surprisingly, printed decanethiol monolayers appear to be significantly better ordered translationally than those formed by standard solution techniques.

Original languageEnglish (US)
Pages (from-to)1595-1598
Number of pages4
JournalLangmuir
Volume15
Issue number5
StatePublished - 1999
Externally publishedYes

Fingerprint

Self assembled monolayers
grazing incidence
self assembly
Monolayers
atomic force microscopy
Defects
defects
diffraction
Self assembly
molecules
Atomic force microscopy
x rays
X ray diffraction
Molecules

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Eberhardt, A. S., Nyquist, R. M., Parikh, A. N., Zawodzinski, T., & Swanson, B. I. (1999). Defects in microcontact-printed and solution-grown self-assembled monolayers. Langmuir, 15(5), 1595-1598.

Defects in microcontact-printed and solution-grown self-assembled monolayers. / Eberhardt, A. S.; Nyquist, R. M.; Parikh, A. N.; Zawodzinski, T.; Swanson, B. I.

In: Langmuir, Vol. 15, No. 5, 1999, p. 1595-1598.

Research output: Contribution to journalArticle

Eberhardt, AS, Nyquist, RM, Parikh, AN, Zawodzinski, T & Swanson, BI 1999, 'Defects in microcontact-printed and solution-grown self-assembled monolayers', Langmuir, vol. 15, no. 5, pp. 1595-1598.
Eberhardt AS, Nyquist RM, Parikh AN, Zawodzinski T, Swanson BI. Defects in microcontact-printed and solution-grown self-assembled monolayers. Langmuir. 1999;15(5):1595-1598.
Eberhardt, A. S. ; Nyquist, R. M. ; Parikh, A. N. ; Zawodzinski, T. ; Swanson, B. I. / Defects in microcontact-printed and solution-grown self-assembled monolayers. In: Langmuir. 1999 ; Vol. 15, No. 5. pp. 1595-1598.
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