Abstract
It is frequently observed that high resolution is difficult to achieve when using atomic force microscopy (AFM) to image "soft-and-sticky" surfaces, such as polymers and biomaterials. A new and simple method, contact resonance imaging (CRI), is introduced to address these issues. In CRI, the sample is modulated at a resonance frequency of the tip-sample contact, while the average position of the tip still remains in contact with the surface, i.e. in the repulsive region of the force-distance curve. The improvement in image resolution is demonstrated using various biological and polymeric specimens under ambient laboratory conditions and in liquid media. The possible mechanism of the resolution improvement is discussed in comparison to other techniques, such as tapping-mode imaging.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 391-398 |
| Number of pages | 8 |
| Journal | Applied Surface Science |
| Volume | 175-176 |
| DOIs | |
| State | Published - May 15 2001 |
| Externally published | Yes |
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Keywords
- AFM
- Contact resonance imaging
- Nanografting
- Protein
- Resolution
- Self-assembled monolayer
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films
- Condensed Matter Physics
Cite this
Contact resonance imaging - A simple approach to improve the resolution of AFM for biological and polymeric materials. / Wadu-Mesthrige, Kapila; Amro, Nabil A.; Garno, Jayne C.; Cruchon-Dupeyrat, Sylvain; Liu, Gang-yu.
In: Applied Surface Science, Vol. 175-176, 15.05.2001, p. 391-398.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Contact resonance imaging - A simple approach to improve the resolution of AFM for biological and polymeric materials
AU - Wadu-Mesthrige, Kapila
AU - Amro, Nabil A.
AU - Garno, Jayne C.
AU - Cruchon-Dupeyrat, Sylvain
AU - Liu, Gang-yu
PY - 2001/5/15
Y1 - 2001/5/15
N2 - It is frequently observed that high resolution is difficult to achieve when using atomic force microscopy (AFM) to image "soft-and-sticky" surfaces, such as polymers and biomaterials. A new and simple method, contact resonance imaging (CRI), is introduced to address these issues. In CRI, the sample is modulated at a resonance frequency of the tip-sample contact, while the average position of the tip still remains in contact with the surface, i.e. in the repulsive region of the force-distance curve. The improvement in image resolution is demonstrated using various biological and polymeric specimens under ambient laboratory conditions and in liquid media. The possible mechanism of the resolution improvement is discussed in comparison to other techniques, such as tapping-mode imaging.
AB - It is frequently observed that high resolution is difficult to achieve when using atomic force microscopy (AFM) to image "soft-and-sticky" surfaces, such as polymers and biomaterials. A new and simple method, contact resonance imaging (CRI), is introduced to address these issues. In CRI, the sample is modulated at a resonance frequency of the tip-sample contact, while the average position of the tip still remains in contact with the surface, i.e. in the repulsive region of the force-distance curve. The improvement in image resolution is demonstrated using various biological and polymeric specimens under ambient laboratory conditions and in liquid media. The possible mechanism of the resolution improvement is discussed in comparison to other techniques, such as tapping-mode imaging.
KW - AFM
KW - Contact resonance imaging
KW - Nanografting
KW - Protein
KW - Resolution
KW - Self-assembled monolayer
UR - http://www.scopus.com/inward/record.url?scp=18144435159&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=18144435159&partnerID=8YFLogxK
U2 - 10.1016/S0169-4332(01)00131-3
DO - 10.1016/S0169-4332(01)00131-3
M3 - Article
VL - 175-176
SP - 391
EP - 398
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
ER -