Confocal fluorescence and Raman microscopy of femtosecond laser-modified fused silica

W. Reichman, James W Chan, D. M. Krol

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Modified lines were written inside Corning 7940 fused silica with 130 fs laser pulses from an amplified Ti-sapphire laser operating at 800 nm at a repetition rate of 1 kHz. The sample was scanned at 20 μm s-1 with laser pulse energies ranging from 1 to 35 μJ, resulting in modified lines with diameters ranging from 8 to 40 μm. Confocal fluorescence and Raman microscopy was used to probe for spatial variations in defect concentration and glass structure across the modified lines. The fluorescence intensity decreased with increasing distance from the line centre, whereas the Raman intensity increased. No significant variations in the concentration of three- and four-membered ring structures were observed.

Original languageEnglish (US)
JournalJournal of Physics Condensed Matter
Volume15
Issue number31
DOIs
StatePublished - Aug 13 2003
Externally publishedYes

Fingerprint

Fused silica
Ultrashort pulses
Laser pulses
Microscopic examination
Fluorescence
silicon dioxide
microscopy
fluorescence
Aluminum Oxide
Sapphire
lasers
ring structures
pulses
Glass
Defects
Lasers
repetition
sapphire
probes
glass

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Confocal fluorescence and Raman microscopy of femtosecond laser-modified fused silica. / Reichman, W.; Chan, James W; Krol, D. M.

In: Journal of Physics Condensed Matter, Vol. 15, No. 31, 13.08.2003.

Research output: Contribution to journalArticle

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