Comparison of material response in fused silica and KDP following exit surface laser- induced breakdown

Stavros G. Demos, Raluca A. Negres, Rajesh N. Raman, Alexander M. Rubenchik, Michael D. Feit

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Crater formation that accompanies laser-induced damage is the result of material ejection following the rapid, localized heating to temperatures on the order of 1 eV. The objective of this work is to compare the material ejection behavior in fused silica and KDP crystals as captured using time-resolved shadowgraphy. These two materials are of fundamental importance in ICF class laser systems but they also represent materials with significantly different physical properties. We hypothesize that these different properties can affect the material ejection process.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume8885
ISBN (Print)9780819497536
DOIs
StatePublished - 2013
Externally publishedYes
Event45th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2013 - Boulder, CO, United States
Duration: Sep 22 2013Sep 25 2013

Other

Other45th Annual Laser Damage Symposium Proceedings - Laser-Induced Damage in Optical Materials: 2013
CountryUnited States
CityBoulder, CO
Period9/22/139/25/13

Keywords

  • DKDP
  • Fused silica
  • KDP
  • Laser ablation
  • Laser-induced breakdown
  • Laser-induced damage
  • Material ejection

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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  • Cite this

    Demos, S. G., Negres, R. A., Raman, R. N., Rubenchik, A. M., & Feit, M. D. (2013). Comparison of material response in fused silica and KDP following exit surface laser- induced breakdown. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8885). [88850W] SPIE. https://doi.org/10.1117/12.2030481