Chemical Force Microscopy: Probing and Imaging Interactions between Functional Groups

Dmitri V. Vezenov, Aleksandr Noy, Charles M. Lieber

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Adhesion and friction forces between surfaces with pre-determined terminal groups were measured by chemically modified scanning probe microscopy tips. Surfaces composed of various terminal groups (CH3, NH2, and SO3H) were obtained by direct chemisorption of silane based compounds on silicon/silicon nitrides. Work of adhesion and friction coefficients were obtained for different types of modified tips and surfaces in aqueous solutions with variations in pH. Absolute values of work of adhesion between various surfaces, Wad, are in the range of 0.5 to 8 mJ/m2. Friction properties vary with pH in a register with adhesive forces showing a broad maximum at intermediate pH values. This behavior can be understood by considering changes in surface charge state which is determined by the zwitterionic nature of silicon nitride surfaces with multiple isoelectric points.

Original languageEnglish (US)
Pages (from-to)312-320
Number of pages9
JournalACS Symposium Series
Volume694
StatePublished - 1998
Externally publishedYes

Fingerprint

Functional groups
Microscopic examination
Imaging techniques
Adhesion
Friction
Silicon nitride
Silanes
Scanning probe microscopy
Silicon
Surface charge
Chemisorption
Adhesives
silicon nitride

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Chemical Force Microscopy : Probing and Imaging Interactions between Functional Groups. / Vezenov, Dmitri V.; Noy, Aleksandr; Lieber, Charles M.

In: ACS Symposium Series, Vol. 694, 1998, p. 312-320.

Research output: Contribution to journalArticle

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