Characterization of Proton Exchange Layer Profiles in KD 2PO 4 Crystals by Micro-Raman Spectroscopy

Thomas R Huser, Christopher W. Hollars, Wigbert J. Siekhaus, James J. De Yoreo, Tayyab I. Suratwala, Teresa A. Land

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

A technique to determine D/H diffusion profiles in DKDP frequency conversion crystals based on micro-Raman spectroscopy was discussed. The method allows to correlate Raman peak positions to deuteration levels in the DKDP crystals. The technique is fast, inexpensive, and works under various environmental conditions allowing better understanding and controlling deuterium depletion in DKDP crystals. The results showed that the shift of the totally symmetric PO 4 stretch mode in the Raman spectrum of DKDP crystals scales linearly with the degree of deuteration.

Original languageEnglish (US)
Pages (from-to)349-351
Number of pages3
JournalApplied Spectroscopy
Volume58
Issue number3
DOIs
StatePublished - Mar 2004
Externally publishedYes

Fingerprint

Raman spectroscopy
Protons
Ion exchange
Crystals
protons
profiles
crystals
Deuterium
frequency converters
Raman scattering
deuterium
depletion
Raman spectra
shift

Keywords

  • Deuterium depletion
  • DKDP crystals
  • Raman spectroscopy

ASJC Scopus subject areas

  • Spectroscopy
  • Instrumentation

Cite this

Huser, T. R., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., & Land, T. A. (2004). Characterization of Proton Exchange Layer Profiles in KD 2PO 4 Crystals by Micro-Raman Spectroscopy. Applied Spectroscopy, 58(3), 349-351. https://doi.org/10.1366/000370204322886726

Characterization of Proton Exchange Layer Profiles in KD 2PO 4 Crystals by Micro-Raman Spectroscopy. / Huser, Thomas R; Hollars, Christopher W.; Siekhaus, Wigbert J.; De Yoreo, James J.; Suratwala, Tayyab I.; Land, Teresa A.

In: Applied Spectroscopy, Vol. 58, No. 3, 03.2004, p. 349-351.

Research output: Contribution to journalArticle

Huser, TR, Hollars, CW, Siekhaus, WJ, De Yoreo, JJ, Suratwala, TI & Land, TA 2004, 'Characterization of Proton Exchange Layer Profiles in KD 2PO 4 Crystals by Micro-Raman Spectroscopy', Applied Spectroscopy, vol. 58, no. 3, pp. 349-351. https://doi.org/10.1366/000370204322886726
Huser, Thomas R ; Hollars, Christopher W. ; Siekhaus, Wigbert J. ; De Yoreo, James J. ; Suratwala, Tayyab I. ; Land, Teresa A. / Characterization of Proton Exchange Layer Profiles in KD 2PO 4 Crystals by Micro-Raman Spectroscopy. In: Applied Spectroscopy. 2004 ; Vol. 58, No. 3. pp. 349-351.
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