Characterization of photolithographically defined NIS tunnel junctions as X-ray sensors

D. Chow, B. Neuhauser, Matthias Frank, C. A. Mears, R. Abusaidi, M. Cunningham, R. M. Golzarian, D. D. Hake, S. E. Labov, M. A. Lindeman, W. E. Owens, B. Sadoulet, A. Slepoy

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