Abstract
We introduce a new method, nanografting, to characterize atomic force microscopy tips. Our technique includes three main steps. First, a self-assembled monolayer (SAM) of thiol is imaged using AFM with a low imaging force. Second, under a high load, a line of new thiols is fabricated within the matrix SAM in a single scan. Finally, the resulting line is imaged by the same AFM tip under a reduced force. From the topographic image of the line, one can extract information regarding the top portion of the AFM tip and the tip-surface contact area during fabrication. The advantages of this approach include its simplicity, high speed, and the ability to characterize the very top portion of the tip. In addition, tips with multiple asperities, which are difficult to investigate using other approaches, can be easily identified and characterized via nanografting.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 649-655 |
| Number of pages | 7 |
| Journal | Applied Surface Science |
| Volume | 175-176 |
| DOIs | |
| State | Published - May 15 2001 |
| Externally published | Yes |
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Keywords
- Atomic force microscopy
- Deconvolution
- Nanografting
- Self-assembled monolayer
- Tip characterization
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films
- Condensed Matter Physics
Cite this
Characterization of AFM tips using nanografting. / Xu, Song; Amro, Nabil A.; Liu, Gang-yu.
In: Applied Surface Science, Vol. 175-176, 15.05.2001, p. 649-655.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Characterization of AFM tips using nanografting
AU - Xu, Song
AU - Amro, Nabil A.
AU - Liu, Gang-yu
PY - 2001/5/15
Y1 - 2001/5/15
N2 - We introduce a new method, nanografting, to characterize atomic force microscopy tips. Our technique includes three main steps. First, a self-assembled monolayer (SAM) of thiol is imaged using AFM with a low imaging force. Second, under a high load, a line of new thiols is fabricated within the matrix SAM in a single scan. Finally, the resulting line is imaged by the same AFM tip under a reduced force. From the topographic image of the line, one can extract information regarding the top portion of the AFM tip and the tip-surface contact area during fabrication. The advantages of this approach include its simplicity, high speed, and the ability to characterize the very top portion of the tip. In addition, tips with multiple asperities, which are difficult to investigate using other approaches, can be easily identified and characterized via nanografting.
AB - We introduce a new method, nanografting, to characterize atomic force microscopy tips. Our technique includes three main steps. First, a self-assembled monolayer (SAM) of thiol is imaged using AFM with a low imaging force. Second, under a high load, a line of new thiols is fabricated within the matrix SAM in a single scan. Finally, the resulting line is imaged by the same AFM tip under a reduced force. From the topographic image of the line, one can extract information regarding the top portion of the AFM tip and the tip-surface contact area during fabrication. The advantages of this approach include its simplicity, high speed, and the ability to characterize the very top portion of the tip. In addition, tips with multiple asperities, which are difficult to investigate using other approaches, can be easily identified and characterized via nanografting.
KW - Atomic force microscopy
KW - Deconvolution
KW - Nanografting
KW - Self-assembled monolayer
KW - Tip characterization
UR - http://www.scopus.com/inward/record.url?scp=0035873690&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0035873690&partnerID=8YFLogxK
U2 - 10.1016/S0169-4332(01)00116-7
DO - 10.1016/S0169-4332(01)00116-7
M3 - Article
VL - 175-176
SP - 649
EP - 655
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
ER -