Abstract
The SrTiO3(001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force microscopy (AFM). The SrTiO3 substrates with TiO2-terminated and atomically smooth surfaces and single unit cell steps have been obtained. The surface morphologies of SrTiO3 substrates strongly depend on the treated conditions and the quality of the substrates.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 459-468 |
| Number of pages | 10 |
| Journal | Science in China, Series G: Physics Astronomy |
| Volume | 48 |
| Issue number | 4 |
| DOIs | |
| State | Published - Aug 2005 |
Keywords
- AFM
- SrTiO
- Surface defects
- Surface morphology
ASJC Scopus subject areas
- General
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Wang, X., Fei, Y., Lu, H., Jin, K., Zhu, X., Chen, Z., Zhou, Y., & Yang, G. (2005). Atomic force microscopy studies of SrTiO3(001) substrates treated by chemical etching and annealing in oxygen. Science in China, Series G: Physics Astronomy, 48(4), 459-468. https://doi.org/10.1360/04yw0181