Atomic force microscopy studies of SrTiO3(001) substrates treated by chemical etching and annealing in oxygen

Xu Wang; Yiyan Fei; Huibin Lu; Kuijuan Jin; Xiangdong Zhu; Zhenghao Chen; Yueliang Zhou; Guozhen Yang

doi:10.1360/04yw0181

Atomic force microscopy studies of SrTiO₃(001) substrates treated by chemical etching and annealing in oxygen

Xu Wang, Yiyan Fei, Huibin Lu, Kuijuan Jin, Xiangdong Zhu, Zhenghao Chen, Yueliang Zhou, Guozhen Yang

Physics, Applied Physics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The SrTiO₃(001) substrates treated by chemical etching in NH₄F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force microscopy (AFM). The SrTiO₃ substrates with TiO₂-terminated and atomically smooth surfaces and single unit cell steps have been obtained. The surface morphologies of SrTiO₃ substrates strongly depend on the treated conditions and the quality of the substrates.

Original language	English (US)
Pages (from-to)	459-468
Number of pages	10
Journal	Science in China, Series G: Physics Astronomy
Volume	48
Issue number	4
DOIs	https://doi.org/10.1360/04yw0181
State	Published - Aug 2005

Keywords

AFM
SrTiO
Surface defects
Surface morphology

ASJC Scopus subject areas

General

Access to Document

10.1360/04yw0181

Cite this

Atomic force microscopy studies of SrTiO₃(001) substrates treated by chemical etching and annealing in oxygen. / Wang, Xu; Fei, Yiyan; Lu, Huibin; Jin, Kuijuan; Zhu, Xiangdong; Chen, Zhenghao; Zhou, Yueliang; Yang, Guozhen.

In: Science in China, Series G: Physics Astronomy, Vol. 48, No. 4, 08.2005, p. 459-468.

Research output: Contribution to journal › Article › peer-review

@article{bf1496fb9c6449d484d099657f966d0f,

title = "Atomic force microscopy studies of SrTiO3(001) substrates treated by chemical etching and annealing in oxygen",

abstract = "The SrTiO3(001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force microscopy (AFM). The SrTiO3 substrates with TiO2-terminated and atomically smooth surfaces and single unit cell steps have been obtained. The surface morphologies of SrTiO3 substrates strongly depend on the treated conditions and the quality of the substrates.",

keywords = "AFM, SrTiO, Surface defects, Surface morphology",

author = "Xu Wang and Yiyan Fei and Huibin Lu and Kuijuan Jin and Xiangdong Zhu and Zhenghao Chen and Yueliang Zhou and Guozhen Yang",

year = "2005",

month = aug,

doi = "10.1360/04yw0181",

language = "English (US)",

volume = "48",

pages = "459--468",

journal = "Science China: Physics, Mechanics and Astronomy",

issn = "1674-7348",

publisher = "Science in China Press",

number = "4",

}

TY - JOUR

T1 - Atomic force microscopy studies of SrTiO3(001) substrates treated by chemical etching and annealing in oxygen

AU - Wang, Xu

AU - Fei, Yiyan

AU - Lu, Huibin

AU - Jin, Kuijuan

AU - Zhu, Xiangdong

AU - Chen, Zhenghao

AU - Zhou, Yueliang

AU - Yang, Guozhen

PY - 2005/8

Y1 - 2005/8

N2 - The SrTiO3(001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force microscopy (AFM). The SrTiO3 substrates with TiO2-terminated and atomically smooth surfaces and single unit cell steps have been obtained. The surface morphologies of SrTiO3 substrates strongly depend on the treated conditions and the quality of the substrates.

AB - The SrTiO3(001) substrates treated by chemical etching in NH4F-buffered HF solution and annealing in oxygen ambient have been studied by an atomic force microscopy (AFM). The SrTiO3 substrates with TiO2-terminated and atomically smooth surfaces and single unit cell steps have been obtained. The surface morphologies of SrTiO3 substrates strongly depend on the treated conditions and the quality of the substrates.

KW - AFM

KW - SrTiO

KW - Surface defects

KW - Surface morphology

UR - http://www.scopus.com/inward/record.url?scp=33644658503&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33644658503&partnerID=8YFLogxK

U2 - 10.1360/04yw0181

DO - 10.1360/04yw0181

M3 - Article

AN - SCOPUS:33644658503

VL - 48

SP - 459

EP - 468

JO - Science China: Physics, Mechanics and Astronomy

JF - Science China: Physics, Mechanics and Astronomy

SN - 1674-7348

IS - 4

ER -