An integrated framework for at-speed and ATE-driven delay test of contract-manufactured ASICs

Vikram Iyengar, Kenneth Pichamuthu, Andy Ferko, Frank Woytowich, Dave Lackey, Gary Grise, Mark Taylor, Mike Degregorio, Steve Oakland

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

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Engineering & Materials Science