An improved method for flat-field correction of flat panel x-ray detector

In this Technical Note, the effects of different flat-field techniques are examined for a cesium iodide flat panel detector, which exhibited a slightly nonlinear exposure response. The results indicate that the variable flat-field correction method with the appropriate polynomial fit provides excellent correction throughout the entire exposure range. The averaged normalized variation factor, used to assess the nonuniformity of the flat-field correction, decreased from 30.76 for the fixed correction method to 4.13 for the variable flat-field correction method with a fourth-order polynomial fit for the 60 kVp spectrum, and from 16.42 to 3.97 for the 95 kVp spectrum.