Adaptive testing - Cost reduction through test pattern sampling

Matt Grady, Bradley Pepper, Joshua Patch, Michael Degregorio, Phil Nigh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In this paper, we will present two different applications of 'test pattern sampling' for logic testing that have significantly improved test cost for Processors and SOCs/ASICs at IBM. The drivers and implementations for these two methods were completely different - one relying on real-time analysis/optimization applied at wafer test; the other based on off-line analysis with daily updates and real-time adjustments at Final Test.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference
DOIs
StatePublished - 2013
Externally publishedYes
Event44th IEEE International Test Conference, ITC 2013 - Anaheim, CA, United States
Duration: Sep 10 2013Sep 12 2013

Other

Other44th IEEE International Test Conference, ITC 2013
CountryUnited States
CityAnaheim, CA
Period9/10/139/12/13

Fingerprint

Adaptive Testing
Application specific integrated circuits
Cost reduction
Sampling
Testing
Costs
Real-time
Wafer
Driver
Adjustment
Update
Logic
Optimization
Line

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Grady, M., Pepper, B., Patch, J., Degregorio, M., & Nigh, P. (2013). Adaptive testing - Cost reduction through test pattern sampling. In Proceedings - International Test Conference [6651891] https://doi.org/10.1109/TEST.2013.6651891

Adaptive testing - Cost reduction through test pattern sampling. / Grady, Matt; Pepper, Bradley; Patch, Joshua; Degregorio, Michael; Nigh, Phil.

Proceedings - International Test Conference. 2013. 6651891.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Grady, M, Pepper, B, Patch, J, Degregorio, M & Nigh, P 2013, Adaptive testing - Cost reduction through test pattern sampling. in Proceedings - International Test Conference., 6651891, 44th IEEE International Test Conference, ITC 2013, Anaheim, CA, United States, 9/10/13. https://doi.org/10.1109/TEST.2013.6651891
Grady M, Pepper B, Patch J, Degregorio M, Nigh P. Adaptive testing - Cost reduction through test pattern sampling. In Proceedings - International Test Conference. 2013. 6651891 https://doi.org/10.1109/TEST.2013.6651891
Grady, Matt ; Pepper, Bradley ; Patch, Joshua ; Degregorio, Michael ; Nigh, Phil. / Adaptive testing - Cost reduction through test pattern sampling. Proceedings - International Test Conference. 2013.
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