A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP

P. DeMange; R. A. Negres; C. W. Carr; H. B. Radousky; S. G. Demos

doi:10.1117/12.585217

A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP

P. DeMange, R. A. Negres, C. W. Carr, H. B. Radousky, S. G. Demos

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Scopus citations

Abstract

We describe a new damage testing approach and instrumentation that provides quantitative measurements of bulk damage versus fluence for several frequencies. A major advantage of this method is that it can simultaneously provide direct information on pinpoint density and size, and beam obscuration. This allows for more accurate evaluation of material performance under operational conditions. Protocols for laser conditioning to improve damage performance can also be easily and rapidly evaluated. This damage testing approach has enabled us to perform complex experiments toward probing the fundamental mechanisms of damage initiation and conditioning.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	G.J. Exarhos, A.H. Guenther, N. Kaiser, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages	343-354
Number of pages	12
Volume	5647
DOIs	https://doi.org/10.1117/12.585217
State	Published - 2005
Externally published	Yes
Event	36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004 - Boulder, CO, United States Duration: Sep 20 2004 → Sep 22 2004

Other

Other	36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004
Country/Territory	United States
City	Boulder, CO
Period	9/20/04 → 9/22/04

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

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DeMange, P., Negres, R. A., Carr, C. W., Radousky, H. B., & Demos, S. G. (2005). A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. In G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5647, pp. 343-354). [35] https://doi.org/10.1117/12.585217

A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. / DeMange, P.; Negres, R. A.; Carr, C. W.; Radousky, H. B.; Demos, S. G.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenther; N. Kaiser; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 5647 2005. p. 343-354 35.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

DeMange, P, Negres, RA, Carr, CW, Radousky, HB & Demos, SG 2005, A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. in GJ Exarhos, AH Guenther, N Kaiser, KL Lewis, MJ Soileau & CJ Stolz (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5647, 35, pp. 343-354, 36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004, Boulder, CO, United States, 9/20/04. https://doi.org/10.1117/12.585217

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A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP

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