A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP

P. DeMange, R. A. Negres, C. W. Carr, H. B. Radousky, S. G. Demos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

We describe a new damage testing approach and instrumentation that provides quantitative measurements of bulk damage versus fluence for several frequencies. A major advantage of this method is that it can simultaneously provide direct information on pinpoint density and size, and beam obscuration. This allows for more accurate evaluation of material performance under operational conditions. Protocols for laser conditioning to improve damage performance can also be easily and rapidly evaluated. This damage testing approach has enabled us to perform complex experiments toward probing the fundamental mechanisms of damage initiation and conditioning.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsG.J. Exarhos, A.H. Guenther, N. Kaiser, K.L. Lewis, M.J. Soileau, C.J. Stolz
Pages343-354
Number of pages12
Volume5647
DOIs
StatePublished - 2005
Externally publishedYes
Event36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004 - Boulder, CO, United States
Duration: Sep 20 2004Sep 22 2004

Other

Other36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004
CountryUnited States
CityBoulder, CO
Period9/20/049/22/04

Fingerprint

damage
evaluation
Testing
conditioning
Lasers
occultation
Experiments
fluence
lasers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

DeMange, P., Negres, R. A., Carr, C. W., Radousky, H. B., & Demos, S. G. (2005). A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. In G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, & C. J. Stolz (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5647, pp. 343-354). [35] https://doi.org/10.1117/12.585217

A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. / DeMange, P.; Negres, R. A.; Carr, C. W.; Radousky, H. B.; Demos, S. G.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / G.J. Exarhos; A.H. Guenther; N. Kaiser; K.L. Lewis; M.J. Soileau; C.J. Stolz. Vol. 5647 2005. p. 343-354 35.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

DeMange, P, Negres, RA, Carr, CW, Radousky, HB & Demos, SG 2005, A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. in GJ Exarhos, AH Guenther, N Kaiser, KL Lewis, MJ Soileau & CJ Stolz (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5647, 35, pp. 343-354, 36th Annual Boulder Damage Symposium Proceedings: Laser-Induced Damage in Optical Materials: 2004, Boulder, CO, United States, 9/20/04. https://doi.org/10.1117/12.585217
DeMange P, Negres RA, Carr CW, Radousky HB, Demos SG. A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. In Exarhos GJ, Guenther AH, Kaiser N, Lewis KL, Soileau MJ, Stolz CJ, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5647. 2005. p. 343-354. 35 https://doi.org/10.1117/12.585217
DeMange, P. ; Negres, R. A. ; Carr, C. W. ; Radousky, H. B. ; Demos, S. G. / A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP. Proceedings of SPIE - The International Society for Optical Engineering. editor / G.J. Exarhos ; A.H. Guenther ; N. Kaiser ; K.L. Lewis ; M.J. Soileau ; C.J. Stolz. Vol. 5647 2005. pp. 343-354
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