Abstract
The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | J.T. Dobbins III, J.M. Boone |
| Pages | 58-64 |
| Number of pages | 7 |
| Volume | 3336 |
| DOIs | |
| State | Published - 1998 |
| Event | Medical Imaging 1998: Physics of Medical Imaging - San Diego, CA, United States Duration: Feb 22 1998 → Feb 24 1998 |
Other
| Other | Medical Imaging 1998: Physics of Medical Imaging |
|---|---|
| Country | United States |
| City | San Diego, CA |
| Period | 2/22/98 → 2/24/98 |
Keywords
- Charge coupled device
- Diffraction
- Experimental physics
- Mammography
- Spectrometer
- X-ray spectra
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
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Cite this
Yu, T., & Boone, J. M. (1998). A diffraction spectrometer for spectral analysis of mammographic x-ray sources. In J. T. Dobbins III, & J. M. Boone (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3336, pp. 58-64) https://doi.org/10.1117/12.317059