A diffraction spectrometer for spectral analysis of mammographic x-ray sources

Tong Yu, John M Boone

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.T. Dobbins III, J.M. Boone
Pages58-64
Number of pages7
Volume3336
DOIs
StatePublished - 1998
EventMedical Imaging 1998: Physics of Medical Imaging - San Diego, CA, United States
Duration: Feb 22 1998Feb 24 1998

Other

OtherMedical Imaging 1998: Physics of Medical Imaging
CountryUnited States
CitySan Diego, CA
Period2/22/982/24/98

Keywords

  • Charge coupled device
  • Diffraction
  • Experimental physics
  • Mammography
  • Spectrometer
  • X-ray spectra

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Yu, T., & Boone, J. M. (1998). A diffraction spectrometer for spectral analysis of mammographic x-ray sources. In J. T. Dobbins III, & J. M. Boone (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3336, pp. 58-64) https://doi.org/10.1117/12.317059