A diffraction spectrometer for spectral analysis of mammographic x-ray sources

Tong Yu; John M Boone

doi:10.1117/12.317059

A diffraction spectrometer for spectral analysis of mammographic x-ray sources

Tong Yu, John M Boone

Radiology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	J.T. Dobbins III, J.M. Boone
Pages	58-64
Number of pages	7
Volume	3336
DOIs	https://doi.org/10.1117/12.317059
State	Published - 1998
Event	Medical Imaging 1998: Physics of Medical Imaging - San Diego, CA, United States Duration: Feb 22 1998 → Feb 24 1998

Other

Other	Medical Imaging 1998: Physics of Medical Imaging
Country/Territory	United States
City	San Diego, CA
Period	2/22/98 → 2/24/98

Keywords

Charge coupled device
Diffraction
Experimental physics
Mammography
Spectrometer
X-ray spectra

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

Access to Document

10.1117/12.317059

Cite this

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title = "A diffraction spectrometer for spectral analysis of mammographic x-ray sources",

abstract = "The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.",

keywords = "Charge coupled device, Diffraction, Experimental physics, Mammography, Spectrometer, X-ray spectra",

author = "Tong Yu and Boone, {John M}",

year = "1998",

doi = "10.1117/12.317059",

language = "English (US)",

volume = "3336",

pages = "58--64",

editor = "{Dobbins III}, J.T. and J.M. Boone",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Medical Imaging 1998: Physics of Medical Imaging ; Conference date: 22-02-1998 Through 24-02-1998",

}

TY - GEN

T1 - A diffraction spectrometer for spectral analysis of mammographic x-ray sources

AU - Yu, Tong

AU - Boone, John M

PY - 1998

Y1 - 1998

N2 - The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.

AB - The use of a diffraction spectrometer developed by Deslattes for determination of mammographic kV is extended to the measurement of accurate, relative x-ray spectra. A series of x-ray spectra were acquired by passing an x-ray beam through a bent-silicon diffraction crystal, and the diffracted x-rays were detected by a charge coupled device (CCD) coupled to an x-ray scintillating screen. The raw spectra were corrected both on the energy axis and on the x-ray photon fluence axis. The measured, corrected x-ray spectra were compared against tabulated x-ray spectra measured under similar conditions. Results indicate that the current device is capable of producing accurate relative x-ray spectra in the mammography energy range.

KW - Charge coupled device

KW - Diffraction

KW - Experimental physics

KW - Mammography

KW - Spectrometer

KW - X-ray spectra

UR - http://www.scopus.com/inward/record.url?scp=0032402935&partnerID=8YFLogxK

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U2 - 10.1117/12.317059

DO - 10.1117/12.317059

M3 - Conference contribution

AN - SCOPUS:0032402935

VL - 3336

SP - 58

EP - 64

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Dobbins III, J.T.

A2 - Boone, J.M.

T2 - Medical Imaging 1998: Physics of Medical Imaging

Y2 - 22 February 1998 through 24 February 1998

ER -

A diffraction spectrometer for spectral analysis of mammographic x-ray sources

Abstract

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Keywords

ASJC Scopus subject areas

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